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GAL20RA10芯片解密

分类:NS系列芯片破解 | 发布:admin | 查看: | 发表时间:2009-11-23

 

对GAL20RA10芯片解密,首先需要对IC芯片本身的内部结构、技术特征及其加密特性进行深入分析,以帮助解密工程师对解密技术实现进行解析,选择最具可靠性和高效性的解密方案。
这里,我们提供对GAL20RA10芯片基本介绍与特性分析,帮助客户及解密工程师对芯片解密进行技术理解与分析。
    关于GAL20RA10芯片
The GAL20RA10 combines a high performance CMOS process with electrically erasable (E2) floating gate technology to provide the highest speed performance available in the PLD market. Lattice Semiconductor’s E2CMOS circuitry achieves power levels as low as 75mA typical ICC which represents a substantial savings in power when compared to bipolar counterparts. E2 technology offers high speed (<100ms) erase times providing the ability to reprogram,reconfigure or test the devices quickly and efficiently.
  The generic architecture provides maximum design flexibility by allowing the Output Logic Macrocell (OLMC) to be configured by the user. The GAL20RA10 is a direct parametric compatible CMOS replacement for the PAL20RA10 device.Unique test circuitry and reprogrammable cells allow complete AC,DC, and functional testing during manufacturing. Therefore, Lattice Semiconductor delivers 100% field programmability and functionality of all GAL products. In addition, 100 erase/write cycles and data retention in excess of 20 years are specified.
  GAL20RA10Features
  HIGH PERFORMANCE E2CMOS? TECHNOLOGY
  — 7.5 ns Maximum Propagation Delay
  — Fmax = 83.3 MHz
  — 9 ns Maximum from Clock Input to Data Output
  — TTL Compatible 8 mA Outputs
  — UltraMOS? Advanced CMOS Technology
  50% to 75% REDUCTION IN POWER FROM BIPOLAR
  — 75mA Typical Icc
  ACTIVE PULL-UPS ON ALL PINS
  E2 CELL TECHNOLOGY
  — Reconfigurable Logic
  — Reprogrammable Cells
  — 100% Tested/100% Yields
  — High Speed Electrical Erasure (<100 ms)
  — 20 Year Data Retention
  TEN OUTPUT LOGIC MACROCELLS
  — Independent Programmable Clocks
  — Independent Asynchronous Reset and Preset
  — Registered or Combinatorial with Polarity
  — Full Function and Parametric Compatibility with PAL20RA10
  PRELOAD AND POWER-ON RESET OF ALL REGISTERS
  — 100% Functional Testability
  APPLICATIONS INCLUDE:
  — State Machine Control
  — Standard Logic Consolidation
  — Multiple Clock Logic Designs
ELECTRONIC SIGNATURE FOR IDENTIFICATION
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Tags: GAL20RA10解密  芯片解密  GAL20RA10破解  
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