EP1K100 ic解密与芯片破解

　　近年来，世纪芯芯片解密研究所依托深圳本地良好的技术研发环境，不仅在疑难解密领域倾注更多的研发资源，同时也在普通单片机低成本解密方案研究领域加大了投入，在技术攻关中成功研究出了EMC单片机、HOTEK单片机、CYPRESS单片机、MXIC单片机等单片机类型的超低成本解密方案，对其中的部分芯片几乎可实现零成本解密，如EMC系列的EM78P153(E) 、EM78P156(E) 、EPM78P447、EM78P451/458/459 ，HOTEK系列的HT46RXX 、HT48RXX 、HT46CXX、HT48CXX，MXIC系列的MX10FLCDPC、MX10FMAXPC 、MX10MAXDQC、MX10E8050I等等，为芯片解密行业的整体发展以及民族产业振兴、世界电子产业的快速进步作出了突出贡献。
　　特别是对芯片解密中的过错攻击技术、硬件安全分析、UV 攻击技术、EEPROM 和 Flash技术分析、安全保护位置的查找以及侵入式攻击与非侵入式攻击技术，世纪芯芯片解密研究所均拥有透彻的理解和丰富的实战应用经验，经过多次反复实验，可以为每一款芯片提供最具经济价值、最具可靠性、最具成本控制优势的解密技术手法。
　　世纪芯芯片解密研究所专业提供ALTERA系列FPGA/CPLD芯片解密服务，我们长期承接各类疑难IC解密、单片机解密、专用芯片解密、DSP解密等项目合作，EP1K100解密是目前我们成功破解的PLD芯片型号，有EP1K100解密需求者请直接与我们联系：
　　芯片解密咨询电话：0755-83676200，83676396
　　咨询QQ：992091822 ，13662281001
　　Email：market2@pcblab.net
　　EP1K100 Feature：
　　Programmable logic devices (PLDs), providing low cost
　　system-on-a-programmable-chip (SOPC) integration in a single
　　device
　　– Enhanced embedded array for implementing megafunctions
　　such as efficient memory and specialized logic functions
　　– Dual-port capability with up to 16-bit width per embedded array
　　block (EAB)
　　– Logic array for general logic functions
　　High density
　　– 10,000 to 100,000 typical gates (see Table 1)
　　– Up to 49,152 RAM bits (4,096 bits per EAB, all of which can be
　　used without reducing logic capacity)
　　Cost-efficient programmable architecture for high-volume
　　applications
　　– Cost-optimized process
　　– Low cost solution for high-performance communications
　　applications
　　System-level features
　　– MultiVoltTM I/O pins can drive or be driven by 2.5-V, 3.3-V, or
　　5.0-V devices
　　– Low power consumption
　　– Bidirectional I/O performance (setup time [tSU] and clock-tooutput
　　delay [tCO]) up to 250 MHz
　　– Fully compliant with the peripheral component interconnect
　　Special Interest Group (PCI SIG) PCI Local Bus Specification,
　　Revision 2.2 for 3.3-V operation at 33 MHz or 66 MHz
　　– -1 speed grade devices are compliant with PCI Local Bus
　　Specification, Revision 2.2 for 5.0-V operation
　　– Built-in Joint Test Action Group (JTAG) boundary-scan test
　　(BST) circuitry compliant with IEEE Std. 1149.1-1990, available
　　without consuming additional device logic.
　　– Operate with a 2.5-V internal supply voltage
　　– In-circuit reconfigurability (ICR) via external configuration
　　devices, intelligent controller, or JTAG port
　　– ClockLockTM and ClockBoostTM options for reduced clock delay,
　　clock skew, and clock multiplication
　　– Built-in, low-skew clock distribution trees
　　– 100% functional testing of all devices; test vectors or scan chains
　　are not required
　　– Pull-up on I/O pins before and during configuration
　　Flexible interconnect
　　– FastTrack? Interconnect continuous routing structure for fast,
　　predictable interconnect delays
　　– Dedicated carry chain that implements arithmetic functions such
　　as fast adders, counters, and comparators (automatically used by
　　software tools and megafunctions)
　　– Dedicated cascade chain that implements high-speed,
　　high-fan-in logic functions (automatically used by software tools
　　and megafunctions)
　　– Tri-state emulation that implements internal tri-state buses
　　– Up to six global clock signals and four global clear signals
　　Powerful I/O pins
　　– Individual tri-state output enable control for each pin
　　– Open-drain option on each I/O pin
　　– Programmable output slew-rate control to reduce switching
　　noise
　　– Clamp to VCCIO user-selectable on a pin-by-pin basis
　　– Supports hot-socketing